Winter Closure
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Overview
Last updated: 9-December-2024
Stanford University's 2024 winter closure will be observed from Monday, December 23, 2024, through Friday, January 3, 2025. The following briefly describes what to expect at SNSF. If needed, SNSF staff will provide further updates through user mailing lists.
Table Notes:
- Note 1: Complete shutdown of all administrative functions during winter closure (Badger requests, card key access, PTA updates). Expect slower processing times after the break.
- Note 2: Instrument available to fully trained and qualified users who have gained independent after-hour access; no staff support or training during the winter break; card key authorization required for building and lab entry.
- Note 3: Usage by pre-approved users only; contact staff for details; no staff support or training during the winter break; card key authorization required for building and lab entry.
- Note 4: Complete shutdown.
- Shutdown of Flexible and Nanopatterning Cleanrooms and associated instruments will be in effect from Friday, December 20, 08:00 until Tuesday, January 7, 08:00. No access permitted in between the dates.
- Spectra TEM: End of day on Dec. 19, LN2 will be topped off and system will be available for use until 5pm, Dec. 20. The cryo cycle will automatically activate and the column conditioned. Spectra will be available starting Jan. 7.
Instrument | Core | Table Note |
---|---|---|
Administration | Administration | 1 |
SEM: TFS Apreo | Electron & Ion Microscopy | 2 |
SEM: FEI Magellan | Electron & Ion Microscopy | 2 |
SEM: Hitachi TM4000+ | Electron & Ion Microscopy | 2 |
SEM: Ion Mill | Electron & Ion Microscopy | 2 |
SEM/FIB: FEI Helios 600i | Electron & Ion Microscopy | 2 |
SEM/FIB: TFS Hydra PFIB | Electron & Ion Microscopy | 2 |
TEM: TFS Spectra | Electron & Ion Microscopy | 4 |
TEM: FEI Tecnai | Electron & Ion Microscopy | 2 |
TEM: FEI Titan | Electron & Ion Microscopy | 2 |
XRD: PANalytical Empyrean | X-ray & Surface Analysis | 2 |
XRD: PANalytical Empyrean 2 | X-ray & Surface Analysis | 2 |
XRD: PANalytical X'Pert 2 | X-ray & Surface Analysis | 2 |
XRD: Multiwire Laue | X-ray & Surface Analysis | 2 |
XRD: Bruker Single Crystal D8 Venture | X-ray & Surface Analysis | 2 |
XCT: Zeiss Xradia 520 Versa X-ray CT | X-ray & Surface Analysis | 2 |
Auger: PHI 700 | X-ray & Surface Analysis | 2 |
XPS: PHI VersaProbe 3 | X-ray & Surface Analysis | 2 |
XPS: PHI VersaProbe 4 | X-ray & Surface Analysis | 2 |
PESA: Riken AC-2 Photoelectron Spectrometer | X-ray & Surface Analysis | 2 |
SIMS: Cameca NanoSIMS 50l | X-ray & Surface Analysis | 3 |
SPM: Park FX-40 | X-ray & Surface Analysis | 2 |
SPM: Park NX-10 | X-ray & Surface Analysis | 2 |
SPM: Bruker Dimension Icon | X-ray & Surface Analysis | 2 |
SPM: Bruker Dimension IconIR | X-ray & Surface Analysis | 2 |
Horiba XploRA+ Raman | X-ray & Surface Analysis | 2 |
Horiba Labram Raman | X-ray & Surface Analysis | 2 |
EBL: Raith EBPG 5200+ | Nanofabrication | 4 |
SEM: FEI Nova SEM | Nanofabrication | 4 |
Litho: ML3 Direct Write (365 nm) | Nanofabrication | 4 |
Litho: ML3 Direct Write (385 nm) | Nanofabrication | 4 |
Deposition: KJL Evaporator 1 and 2 | Nanofabrication | 4 |
Deposition: Cressington Sputter Coater | Nanofabrication | 4 |
Deposition: Oerlikon Univex Sputter | Nanofabrication | 4 |
Etch: Oxford PlasmaPro 80 RIE | Nanofabrication | 4 |
Etch: Intlvac Ion Mill | Nanofabrication | 4 |
Film Thickness: Film Sense FS-1 | Nanofabrication | 4 |
Film Thickness: Filmetrics F40 | Nanofabrication | 4 |
Profilometer: Dektak XT-S Stylus Profiler | Nanofabrication | 4 |
Profilometer: KLA Tencor Alpha Step D-500 | Nanofabrication | 4 |
Microscopy: Keyence VK-X 3D Laser Confocal | Nanofabrication | 4 |
Microscopy: Nikon LV100ND | Nanofabrication | 4 |
Asher: March Instruments PX-250 Plasma Asher | Nanofabrication | 4 |
UV: American Ultraviolet Cool Cure UV Exposure Chamber | Nanofabrication | 4 |
Oven: VST High Vacuum Oven | Nanofabrication | 4 |
Nanopatterning Cleanroom | Nanofabrication | 4 |
Flexible Cleanroom | Nanofabrication | 4 |
Microfab Shop | Nanofabrication | 4 |
Westbond Wire Bonder | Nanofabrication | 2 |
3D Printer | Nanofabrication | 2 |
Contact Angle Goniometer: Rame-Hart 290 | Soft & Hybrid Materials | 2 |
DLS: Brookhaven instrument Nanobrook Omni | Soft & Hybrid Materials | 2 |
DMA: TA Instrument Q800 | Soft & Hybrid Materials | 2 |
DSC: TA Instrument Q2500 | Soft & Hybrid Materials | 2 |
Ellipsometer: Horiba UVISEL | Soft & Hybrid Materials | 2 |
RT-GPC: Tosoh Room-temperature EcoSEC | Soft & Hybrid Materials | 2 |
HT-GPC: Tosoh High-temperature EcoSEC | Soft & Hybrid Materials | 2 |
HT-TGA/DSC: TA Instrument SDT 650 | Soft & Hybrid Materials | 2 |
LB Trough: Biolin Scientific KSV 5000 | Soft & Hybrid Materials | 2 |
Mechanical Testing: Instron 5565 | Soft & Hybrid Materials | 2 |
Microscopy: Nikon LV100 | Soft & Hybrid Materials | 2 |
Oxygen Plasma Cleaner: Diener Pico | Soft & Hybrid Materials | 2 |
Particle Analysis: NovaTouch | Soft & Hybrid Materials | 2 |
Particle Analysis: Autosorb iQ3 | Soft & Hybrid Materials | 2 |
Particle Analysis: Poremaster 33 | Soft & Hybrid Materials | 2 |
Profilometer: Bruker Dektak XT-A | Soft & Hybrid Materials | 2 |
Rheometer: TA Instrument ARES-G2 | Soft & Hybrid Materials | 2 |
Rheometer-DMA: TA Instrument ARES-G2 | Soft & Hybrid Materials | 2 |
Rheosense | Soft & Hybrid Materials | 2 |
Rheosense mVROC Small-Volume Viscometer | Soft & Hybrid Materials | 2 |
Spectroscopy: Agilent Cary 6000i UV/Vis/NIR | Soft & Hybrid Materials | 2 |
Spectroscopy: Horiba FluoroLog Fluorimeter | Soft & Hybrid Materials | 2 |
Spectroscopy: Nicolet iS50 FT/IR Spectrometer | Soft & Hybrid Materials | 2 |
TGA: TA Instrument Q5500 | Soft & Hybrid Materials | 2 |