Buehler AutoMet
Provides automated large specimen polishing on multiple samples
Eligibility
Prerequisites
- Users must have an active Badger account
- Must complete Moore 184 safety orientation
- Read and understand the SOP
- Schedule and complete one in-person training session with the sample prep staff
Overview
The Buehler AutoMet 250 is a semi-automated polishing system for high quality surface preparation of samples that will be analyzed by optical microscopy, and scanning electron microscopy (SEM). Polishing can be done manually, or using the pressurized automated polishing pistons and a fluid pump for long surface polishing. It also has a filter system and various polishing suspensions can be used, such as colloidal silica.
- Initial polishing is done with silicon carbide grinding discs.
- Final polishing is done with polishing pad and colloidal silica.
This system is also used for surface finishing during transmission electron microscopy (TEM) preparation workflows. Before focused ion beam (FIB) lamella preparation, electropolishing, or in some ultra-microtome cases, the surface of the sample should be polished.
- Manual or automated polishing.
- Final surface finish down to 0.05 microns.
Backscatter Electron Image
Backscatter electron image of mineral phases after polishing with Buehler AutoMet 250 and imaging with Phenom Pharos SEM.
Phase Map
Mineral phase map of polished rock surface using the Buehler AutoMet 250 and Phenom Pharos SEM.
System Specifications
| Specifications | |
|---|---|
| Motor Power | 1Hp [750W] |
| Platen Diameter | 8in [203mm] |
| Platen Wheel Speed | 10-500rpm in 10rpm increments |
| Wheel Direction | Clockwise or Counter-Clockwise |
| Head Speed | 30-60rpm in 10rpm increments |
| Central Specimen Force | 5-60 lbs [20-260N] |
| Single Specimen Force | 1-10 lbs [5-45N] |
| Central Force Specimen Capacity | 1in, 1.25in, 1.5in, 25mm, 30mm, 40mm and large or irregular specimens |
| Single Force Specimen Capacity | 1in, 1.25in, 1.5in, 25mm, 30mm |