Facilities & Equipment
The Spilker building is home to our two cleanroom facilities, featuring electron beam lithography, deposition, etching and a range of other tools to enable nanofabrication.
Electron & Ion Microscopy
The Electron & Ion Microscopy facilities feature some of the most advanced tools for Scanning Electron Micoscopy (SEM), Transmission Electron Microscopy (TEM) and Focused Ion Beam (FIB).
X-ray & Surface Analysis
At the core of the XSA facilities are X-ray Diffraction (XRD), X-ray Photoelectron Spectroscopy (XPS), NanoSIMS and a range of other Scanning Probe Micoscopy capabilites.
Soft & Hybrid Materials Facility
SMF is dedicated to fundamental research on interfaces found in systems containing polymers and low molecular weight amphiphiles.