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Student working at Titan transmission electron microscope.

Electron & Ion Microscopy (EIM)

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The Electron & Ion Microscopy facilities in the McCullough, Moore and Spilker buildings features some of the most advanced tools for Scanning Electron Micoscopy (SEM), Transmission Electron Microscopy (TEM) and Focused Ion Beam (FIB).

Tool Summary

InstrumentLocationLab Phone
SEM: TFS ApreoSpilker 008I650-725-2278
SEM: FEI MagellanSpilker 008A650-725-2278
SEM: Hitachi TM4000+Spilker 008 
SEM: Ion MillMcCullough 101 
SEM/FIB: FEI Helios 600iSpilker 008B650-736-6795
SEM/FIB: TFS Hydra PFIBSpilker 007650-497-8352
TEM: TFS SpectraSpilker 008K 
TEM: FEI TecnaiMcCullough 107650-725-4684
TEM: FEI TitanSpilker 008E650-723-1575
TEM: Sample PreparationMoore 184 
TEM: Specimen Holders