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Operations During COVID-19
Student working at Titan transmission electron microscope.

Electron & Ion Microscopy (EIM)

The Electron & Ion Microscopy facilities in the McCullough, Moore and Spilker buildings features some of the most advanced tools for Scanning Electron Micoscopy (SEM), Transmission Electron Microscopy (TEM) and Focused Ion Beam (FIB).

Tool Summary

Instrument Location Lab Phone
SEM: TFS Apreo Spilker 008I 650-725-2278
SEM: FEI Magellan Spilker 008A 650-725-2278
SEM: Ion Mill McCullough 101  
SEM/FIB: FEI Helios 600i Spilker 008B 650-736-6795
TEM: FEI Tecnai McCullough 107 650-725-4684
TEM: FEI Titan Spilker 008E 650-723-1575
TEM: Sample Preparation Moore 184  
TEM: Specimen Holders