Electron & Ion Microscopy (EIM)
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The Electron & Ion Microscopy facilities in the McCullough, Moore and Spilker buildings features some of the most advanced tools for Scanning Electron Micoscopy (SEM), Transmission Electron Microscopy (TEM) and Focused Ion Beam (FIB).
Tool Summary
| Instrument | Location | Lab Phone |
|---|---|---|
| SEM: TFS Apreo | Spilker 008I | 650-725-2278 |
| SEM: FEI Magellan | Spilker 008A | 650-725-2278 |
| SEM: Ion Mill | McCullough 101 | |
| SEM/FIB: FEI Helios 600i | Spilker 008B | 650-736-6795 |
| TEM: TFS Spectra | Spilker 008K | |
| TEM: FEI Tecnai | McCullough 107 | 650-725-4684 |
| TEM: FEI Titan | Spilker 008E | 650-723-1575 |
| TEM: Sample Preparation | Moore 184 | |
| TEM: Specimen Holders |