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EBL: Raith VOYAGER
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EBL: GenISys Software
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SEM: Nova SEM
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Deposition: KJL Evaporator
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Etch: Oxford RIE
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Profilometer: Dektak XT-S Profiler
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Reflectometry: Filmetrics F40
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Microscopy: Keyence Laser Confocal
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Litho: ML3 Direct Write
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Deposition: Sputter
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Etch: Intlvac Ion Mill
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Profilometer: KLA Tencor Alpha Step
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Asher: Plasma Asher
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Deposition: Big Evaporator
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TEM: Sample Prep
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XRD: Empyrean
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XRD: D8 Venture
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XCT: Versa X-ray CT
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Auger: PHI 700
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XPS: VersaProbe 3
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XPS: VersaProbe 4
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PESA: Photoelectron Spectrometer
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SIMS: NanoSIMS
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SPM: XE-70 & XE-100
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SPM: SQUID
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Quantum Dot Nanoparticle Sizing
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Contact Angle Goniometer
DLS: Nanobrook Omni
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DMA: TAI Q800
DSC: TAI Q2000
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Ellipsometer: UVISEL
RT-GPC: Tosoh EcoSEC
HT-GPC: Tosoh EcoSEC
HT-TGA/DSC: SDT650
LB Trough: KN2002
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Mechanical Testing: Instron 5565
Microscopy: Nikon
Oxygen Plasma Cleaner: Diener Pico
Particle Analysis: NovaTouch
Particle Analysis: Autosorb iQ3
Particle Analysis: Poremaster 33
Profilometer: Dektak
Rheometer: TAI ARES
Spectroscopy: UV/Vis/NIR
Spectroscopy: Fluorimeter
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AFM: Park NX-10
TGA: TAI Q500
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