TEM: FEI Titan Environmental Transmission Electron Microscope
SNSF houses a state-of-the-art FEI 80-300 kV environmental transmission electron microscope (ETEM) with the following capabilities:
- Accelerating voltages at 80 and 300 kV
- High brightness field emission gun (X-FEG)
- Cs image corrector
- Lorentz lens for imaging magnetic samples
- Low-dose exposure management software
- TEM and STEM tomography
- Both Gatan OneView camera and K3 direct electron detector for TEM imaging
- Energy-dispersive X-ray spectroscopy (EDS) with Oxford Xmax SDD Detector
- Electron-energy loss spectroscopy (EELS) with Dual EELS using the Gatan Quantum 966 spectrometer
- Environmental mode, allowing a mixture of up to 3 gases into the specimen region of the TEM (guidance on allowable gases and pressures on request)
- Image resolution (TEM mode): 0.07 nm
- Probe resolution (STEM mode): 0.14 nm (at 300kV)
- Energy resolution: ~ 1 eV (monochromator off), 0.1 eV (monochromator on)
First, make sure to check out some of the information below to understand the account creation and training process. Then...
Want to know more about the capabilities of the Titan or having trouble planning your experiment?
In order to become a qualified user on the FEI Titan TEM, the following steps need to be completed:
- Become a lab member of SNSF and follow the instructions to activate a Badger account.
- Add yourself to the Titan users mailing list to receive system status updates by going to http://mailman.stanford.edu, scrolling down to "Manage Subscriptions" and searching "titan_users"; fill out the information requested to subscribe.
- Complete the training for the FEI Tecnai TEM. Before being considered for training on the FEI Titan TEM, you must first be a fully qualified and proficient user of the Tecnai.
- Complete the training request form to coordinate subsequent training. Basic Titan training consists of Titan microscope alignments and aberration (image corrector) tuning, typically completed in two 4-hour sessions and a 3-hour final. Additional observation by staff required during first 3 independent sessions.
- Further training on specific techniques can be requested following basic training, which includes the following:
|STEM Imaging||EDS Analysis|
|TEM Tomography||Monochromator Training (imaging or EELS)|
|STEM Tomography||EELS and EFTEM|
|Environmental TEM||Electron holography|
The Materials Science and Engineering Department at Stanford also offers accredited courses on TEM theory and TEM laboratory.