SEM Fischione Model 1061 Ion Mill
The instrument is a Fischione Model 1061 SEM Mill, located in McCullough Building Room 101. It is a broad-beam argon ion milling and polishing system to produce high-quality, flat surfaces in either plan-view or cross-section orientations.
- Two independently adjustable ion sources
- 100 eV to 10 KeV
- Beam current density up to 10 mA/cm2
- Milling angle range of 0 to +10º
- Choice of single or dual ion source operation
- Sample size:
- Cross section
- Maximum 10 x 10 x 4 mm
- Minimum 3 x 3 x 0.7 mm
- Maximum 1.25 in. diameter x 1 in. height (32 x 25 mm)
- These can be mounted using the same planar pin stub mounts as used on the Thermo Fisher/FEI SEMs in our facility
- Cross section
- Automatic sample thickness sensing
- 360º sample rotation with variable rotation speed
- Sample rocking
- Sample cooling (liquid nitrogen) with automated temperature interlocks
- Extended dewar capacity (18+ hours of cryo conditions)
- Integrated heater to maintain specific temperature between ambient and cryogenic
- Vacuum transfer vessel
- 525X microscope and CMOS camera for image acquisition, display, and end pointing
In order to become a qualified user Ion Mill, you need to follow each of these steps in the order as listed here:
- Complete the process to become a lab member of SNSF and follow the instructions to activate a Badger account.
- Complete the SNSF COVID-19 Authorization protocol and receive notification of authorization.
- Subscribe to firstname.lastname@example.org by going to the Stanford mailing list tools and request subscription to sem-mill-1061. (Note: it is not searchable on the public lists).
- Respond to the training announcements that are regularly posted to that list. If necessary, send an email to Rich Chin to request a new training be created.
- Complete a supervised session.
Further inquiries may be directed to Rich Chin.