Profilometer: Dektak XT-S Stylus Profiler
The Dektak XT-S Stylus Profiler is capable of quickly and accurately measuring feature heights on a surface. With noise levels approaching 2-3nm it is capable of resolving step heights as small as 10nm. Variable force and measurement length settings make measurements possible on a wide range of materials and structures. A magnified video targeting system permits positioning the needle tip near small surface features.
In order to become a qualified user of the Dektak Profiler, you need to follow each of these steps in the order as listed here:
- Complete the process to become a lab member of SNSF and follow the instructions to activate a Badger account.
- Complete the process to become a Nanopatterning Cleanroom user.
- Review the training video playlist and SOP. Once done, email staff so you can be qualified on Badger. No further training is required. If you require further assistance, please contact staff.