X-ray & Surface Analysis Facilities (XSA)
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The X-ray & Surface Analysis facilities within the McCullough and Spilker buildings feature advanced NanoSIMS, XPS, XRD and SPM characterization techniques.
| Instrument | Location | Phone |
| XRD: PANalytical Empyrean | McCullough 117 | 650-736-1186 |
| XRD: PANalytical X'Pert 2 | McCullough 117 | 650-736-1186 |
| XRD: Multiwire Laue | McCullough 117 | 650-736-1186 |
| XRD: Bruker Single Crystal D8 Venture | McCullough 117 | 650-736-1186 |
| XCT: Zeiss Xradia Versa 520 X-ray CT | McCullough 108 | |
| Auger: PHI 700 | McCullough 112 | 650-723-6960 |
| XPS: PHI VersaProbe 3 | McCullough 112 | 650-723-6960 |
| XPS: PHI VersaProbe 4 | McCullough 112 | 650-723-6960 |
| PESA: Riken AC-2 Photoelectron Spectrometer | McCullough 112 | 650-723-6960 |
| SIMS: Cameca NanoSIMS 50l | Spilker 008C | 650-725-2737 |
| SPM: Park XE-70 | McCullough 102 | 650-723-4875 |
| SPM: Park XE-100 | McCullough 102 | 650-723-4875 |
| SPM: Park NX-10 | Shriram 099 | |
| SPM: Bruker Dimension Icon | Spilker 007 | 650-497-8352 |
| Horiba Labram Raman | McCullough 105 | |
| Horiba XploRA+ Raman | McCullough 105 | |
| SPM: Scanning SQUID Microscope | McCullough | 650-492-5090 |