X-ray & Surface Analysis Facilities (XSA)

The X-ray & Surface Analysis facilities within the McCullough, Spilker, and Shriram buildings feature advanced NanoSIMS, XPS, XRD and SPM characterization techniques.

Instrument	Location	Phone
XRD: PANalytical Empyrean	McCullough 117	650-736-1186
XRD: PANalytical X'Pert 2	McCullough 117	650-736-1186
XRD: Multiwire Laue	McCullough 117	650-736-1186
XRD: Bruker Single Crystal D8 Venture	McCullough 117	650-736-1186
XCT: Zeiss Xradia Versa 520 X-ray CT	McCullough 108
Auger: PHI 700	McCullough 112	650-723-6960
XPS: PHI VersaProbe 3	McCullough 112	650-723-6960
XPS: PHI VersaProbe 4	McCullough 112	650-723-6960
PESA: Riken AC-2 Photoelectron Spectrometer	McCullough 112	650-723-6960
SIMS: Cameca NanoSIMS 50l	Spilker 008C	650-725-2737
SPM: Park FX-40	McCullough 102	650-723-4875
SPM: Park NX-10	McCullough 102	650-723-4875
SPM: Bruker Dimension Icon	Shriram 099
SPM: Bruker Dimension IconIR	Shriram 099
Horiba Labram Raman	McCullough 105
Horiba XploRA+ Raman	McCullough 105
Microscopy: EVO Cam II	McCullough 100; Flexible Cleanroom; Nanopatterning Cleanroom

X-ray & Surface Analysis Facilities (XSA)

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